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Number 3

Fingerprint Biometric Authentication for Enhancing Staff Attendance System

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  • Oloyede Muhtahir O. and Addoyin Adeyinka O. and Adewole Kayode S. 2013. Fingerprint Biometric Authentication for Enhancing Staff Attendance System. International Journal of Applied Information Systems. 5, 3 (February 2013), 19-24. DOI=http://dx.doi.org/10.5120/ijais450867
  • @article{10.5120/ijais2017451568,
    author = {Oloyede Muhtahir O. and Addoyin Adeyinka O. and Adewole Kayode S.},
    title = {Fingerprint Biometric Authentication for Enhancing Staff Attendance System},
    journal = {International Journal of Applied Information Systems},
    issue_date = {February 2013},
    volume = {5},
    number = {},
    month = {February},
    year = {2013},
    issn = {},
    pages = {19-24},
    numpages = {},
    url = {/archives/volume5/number3/426-0867},
    doi = { 10.5120/ijais12-450867},
    publisher = { xA9 2012 by IJAIS Journal},
    address = {}
    }
    
  • %1 450867
    %A Oloyede Muhtahir O. 
    %A Addoyin Adeyinka O.
    %A Adewole Kayode S.
    %T Fingerprint Biometric Authentication for Enhancing Staff Attendance System
    %J International Journal of Applied Information Systems
    %@ 
    %V 5
    %N 
    %P 19-24
    %D 2013
    %I  xA9 2012 by IJAIS Journal
    

Abstract

In electronics memories are the widely used elements. As the transistor size shrinks multiple-bit upset (MCUs) are increasing due to radiation effects in memories. This affects the reliability of memories. Interleaving and built-in current sensors (BICS) have been success in the case of single event upset (SEC). The process is taken one step further by proposing specific error correction codes to protect memories against multiple-bit upsets and to improve yield have been proposed. The method is evaluated using fault injection experiments. The results are compared with known techniques such as Hamming codes. The proposed codes provide a better performance compared to that of the hamming codes in terms of Single Event Upset. In the case of the Multi Bit Upset it provides better coverage in error deduction and correction schemes.

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Keywords

Biometric, verification, staff attendance, telecommunication, productivity

Index Terms

Computer Science
Information Sciences